• Journals
  • Discipline
  • Indexed
  • Institutions
  • About
JavaScript is disabled for your browser. Some features of this site may not work without it.
View Item 
  •   Home
  • Universidad Alberto Hurtado
  • Journal of Technology Management & Innovation
  • View Item
  •   Home
  • Universidad Alberto Hurtado
  • Journal of Technology Management & Innovation
  • View Item

The Usefulness of Patent Stage and Sectoral Pattern in Open Innovation Licensing

The Usefulness of Patent Stage and Sectoral Pattern in Open Innovation Licensing;
The Usefulness of Patent Stage and Sectoral Pattern in Open Innovation Licensing

Author
Kim, Jun Young

Park, Yongtae

Full text
https://www.jotmi.org/index.php/GT/article/view/art96
10.4067/S0718-27242008000200004
Abstract
The relative importance to the particular industry of licensing has not been done enough empirically to pursue the route of the open innovation. That is why the industrial level research on open innovation is more complicated than that of company level. This paper tries to survey industrial level licensing by combining the technology regime theory with NTB(National Technology Bank) score model of KTTC(Korea Technology Transfer Center) and tries to transform Likert score into general value proxy by using information of valuator’s organizations. This paper also introduces two new factors named as ‘patent authorization stage’ for classifying patent status and ‘technology regime based industrial innovation pattern’ for adopting sectoral level research in order to overcome drawbacks of score model in case of application to open innovation licensing.
 
The relative importance to the particular industry of licensing has not been done enough empirically to pursue the route of the open innovation. That is why the industrial level research on open innovation is more complicated than that of company level. This paper tries to survey industrial level licensing by combining the technology regime theory with NTB(National Technology Bank) score model of KTTC(Korea Technology Transfer Center) and tries to transform Likert score into general value proxy by using information of valuator’s organizations. This paper also introduces two new factors named as ‘patent authorization stage’ for classifying patent status and ‘technology regime based industrial innovation pattern’ for adopting sectoral level research in order to overcome drawbacks of score model in case of application to open innovation licensing.
 
The relative importance to the particular industry of licensing has not been done enough empirically to pursue the route of the open innovation. That is why the industrial level research on open innovation is more complicated than that of company level. This paper tries to survey industrial level licensing by combining the technology regime theory with NTB(National Technology Bank) score model of KTTC(Korea Technology Transfer Center) and tries to transform Likert score into general value proxy by using information of valuator’s organizations. This paper also introduces two new factors named as ‘patent authorization stage’ for classifying patent status and ‘technology regime based industrial innovation pattern’ for adopting sectoral level research in order to overcome drawbacks of score model in case of application to open innovation licensing.
 
Metadata
Show full item record
Discipline
Artes, Arquitectura y UrbanismoCiencias Agrarias, Forestales y VeterinariasCiencias Exactas y NaturalesCiencias SocialesDerechoEconomía y AdministraciónFilosofía y HumanidadesIngenieríaMedicinaMultidisciplinarias
Institutions
Universidad de ChileUniversidad Católica de ChileUniversidad de Santiago de ChileUniversidad de ConcepciónUniversidad Austral de ChileUniversidad Católica de ValparaísoUniversidad del Bio BioUniversidad de ValparaísoUniversidad Católica del Nortemore

Browse

All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

My Account

LoginRegister
Dirección de Servicios de Información y Bibliotecas (SISIB) - Universidad de Chile
© 2019 Dspace - Modificado por SISIB