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Trends and Volatilities in Heterogeneous Patent Quality in Taiwan;
Trends and Volatilities in Heterogeneous Patent Quality in Taiwan

dc.creatorLu, Wen-Cheng
dc.creatorChen, Jong-Rong
dc.creatorTung, I-Hsuan
dc.date2009-07-21
dc.identifierhttps://www.jotmi.org/index.php/GT/article/view/art116
dc.identifier10.4067/S0718-27242009000200006
dc.descriptionThis study analyzes patent trends and volatilities for three heterogeneous quality patents in the Taiwan patent system from January 1973 to June 2006. The estimated models are symmetric GARCH and asymmetric EGARCH, providing full sample, rolling sample, and out-of-sample evidence. Three different patent types exhibit increasing trends, using monthly time series data from our samples. ”New design” patents also show time-varying volatility but other types of patents fail to reject the ARCH LM test. Findings show the asymmetric EGARCH model suitable for “new design” patent type through out of sample forecasts.en-US
dc.descriptionThis study analyzes patent trends and volatilities for three heterogeneous quality patents in the Taiwan patent system from January 1973 to June 2006. The estimated models are symmetric GARCH and asymmetric EGARCH, providing full sample, rolling sample, and out-of-sample evidence. Three different patent types exhibit increasing trends, using monthly time series data from our samples. ”New design” patents also show time-varying volatility but other types of patents fail to reject the ARCH LM test. Findings show the asymmetric EGARCH model suitable for “new design” patent type through out of sample forecasts.es-ES
dc.descriptionThis study analyzes patent trends and volatilities for three heterogeneous quality patents in the Taiwan patent system from January 1973 to June 2006. The estimated models are symmetric GARCH and asymmetric EGARCH, providing full sample, rolling sample, and out-of-sample evidence. Three different patent types exhibit increasing trends, using monthly time series data from our samples. ”New design” patents also show time-varying volatility but other types of patents fail to reject the ARCH LM test. Findings show the asymmetric EGARCH model suitable for “new design” patent type through out of sample forecasts.pt-BR
dc.formatapplication/pdf
dc.languageeng
dc.publisherFacultad de Economía y Negocios, Universidad Alberto Hurtadoen-US
dc.relationhttps://www.jotmi.org/index.php/GT/article/view/art116/489
dc.rightsCopyright (c) 2009 Journal of Technology Management & Innovationen-US
dc.rightshttps://creativecommons.org/licenses/by-sa/4.0en-US
dc.sourceJournal of Technology Management & Innovation; Vol. 4 No. 2 (2009); 69-81en-US
dc.sourceJournal of Technology Management & Innovation; Vol. 4 Núm. 2 (2009); 69-81es-ES
dc.source0718-2724
dc.subjectpatent trendsen-US
dc.subjectquality patentsen-US
dc.subjectTaiwan.en-US
dc.titleTrends and Volatilities in Heterogeneous Patent Quality in Taiwanen-US
dc.titleTrends and Volatilities in Heterogeneous Patent Quality in Taiwanes-ES
dc.titleTrends and Volatilities in Heterogeneous Patent Quality in Taiwanpt-BR
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/publishedVersion
dc.typeArtículo revisado por paresen-US


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